Microscope Lamps and Accessories
Electron Microscopy Sciences Cross Scale Reticle RET 32, 19 mm, 20 mm Scale, 0.10 mm x 200 Divisions
High quality, precision made standard reticles are manufactured to use with our microscope eyepieces. All recticles are chrome on glass and positive polarity.
Size: 19 mm
Scale: 20 mm
Divisions: 0.10 mm x 200
Electron Microscopy Sciences Grain Sizing Reticle NG60, 23 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 23 mm
Method: EN 10247
Electron Microscopy Sciences Grain Sizing Reticle NG60, 24.5 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 24.5 mm
Method: EN 10247
Electron Microscopy Sciences Grain Sizing Reticle NG61, 21 mm
For the determination of non-metallic inclusion content of steel. NG60 meets EN 10247 and NG61 Meets ISO 4976. Both are scaled for use eith 10x objective magnification Pattern
Size: 21 mm
Method: ISO 4967
Electron Microscopy Sciences Athene Multiple Slots Grid, Copper
Athene grids are renowned for the highest quality standards, exceptionally refined grid bars, and good handling characteristics. 3.05 mm diameter.
Material: Copper
Electron Microscopy Sciences Embra Finder 400 mesh Grid, Copper
Standard 3.05 mm diameter grids which have one straight and one round cut out from the rim which assists in the orientation of the grid.
Grid: Copper
Electron Microscopy Sciences Grating Replica Parallel Line
Shadowcast carbon replica of diffraction parallel line gratings with spacing of 462.9 nm, 2160 lines per millimeter onto 3.05mm grid.
Electron Microscopy Sciences Metallurgical Graticle G41, 19mm, ASTM Austenite 1:1
Standard pattern discs for metallurgical stereometric analysis of grain size in polished metal sections. ASTM grain size austenite, glass sandwich.
Size: 19mm
Method: ASTM Austenite 1:1
Surface: Glass sandwich
Electron Microscopy Sciences Gilder Parallel Bar Grid G200PB, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 125 µm
Hole: 80 µm
Bar: 45 µm
Electron Microscopy Sciences Gilder Parallel Bar Grid G200P, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 125 µm
Hole: 80 µm
Bar: 45 µm
Electron Microscopy Sciences Gilder Parallel Bar Grid G300PB, Nickel
Gilder grids are a reliable support specimen grid for transmission electron microscopy. They feature a well-defined grid bars, maximum open area, and a matt/shiny side. Each grid is individually inspected.
Material: Nickel
Pitch: 83 µm
Hole: 48 µm
Bar: 35 µm
Electron Microscopy Sciences SEM Finder Grid SEMF1, Copper
Designed to aid in the identification and localization of SEM specimens when placed on standard SEM stubs. Four quadrant markers tapered towards center. 100 radial sectors.
Material: Copper
Diameter: 10 mm
Thickness: ~50 µm
Electron Microscopy Sciences Hitachi SEM Cylinder Mount 9/16", 3/8" height, Aluminum
Hitachi SEM mounts are made from lathe finished ultra-pure aluminum.
Electron Microscopy Sciences JEOL SEM Cylinder Mount 1/2" surface, 3/8" height, Aluminum
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from ultra-pure aluminum with a standard lathe finish.
Head: 1/2"
Height: 3/8"
